화학공학소재연구정보센터
검색결과 : 4건
No. Article
1 Experimentation and modeling of organic photocontamination on lithographic optics
Kunz RR, Liberman V, Downs DK
Journal of Vacuum Science & Technology B, 18(3), 1306, 2000
2 157 nm: Deepest deep-ultraviolet yet
Rothschild M, Bloomstein TM, Curtin JE, Downs DK, Fedynyshyn TH, Hardy DE, Kunz RR, Liberman V, Sedlacek JHC, Uttaro RS, Bates AK, Van Peski C
Journal of Vacuum Science & Technology B, 17(6), 3262, 1999
3 Outlook for 157 nm resist design
Kunz RR, Bloomstein TM, Hardy DE, Goodman RB, Downs DK, Curtin JE
Journal of Vacuum Science & Technology B, 17(6), 3267, 1999
4 Outgassing of organic vapors from 193 nm photoresists: Impact on atmospheric purity near the lens optics
Kunz RR, Downs DK
Journal of Vacuum Science & Technology B, 17(6), 3330, 1999