검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Assessing the performance of two-dimensional dopant profiling techniques Duhayon N, Eyber P, Fouchier M, Clarysee T, Vandervorst W, Alvarez D, Schoemann S, Ciappa M, Stangoni M, Fichtner W, Formanek P, Kittler M, Raineri V, Giannazzo F, Goghero D, Rosenwaks Y, Shikler R, Saraf S, Sadewasser S, Barreau N, Glatzel T, Verheijen M, Mentink SAM, von Sprekelsen M, Maltezopoulos T, Wiesendanger R, Hellemans L Journal of Vacuum Science & Technology B, 22(1), 385, 2004 |
| 2 |
Carrier spilling revisited: On-bevel junction behavior of different electrical depth profiling techniques Clarysse T, Eyben P, Duhayon N, Xu MW, Vandervorst W Journal of Vacuum Science & Technology B, 21(2), 729, 2003 |
| 3 |
Bias-induced junction displacements in scanning spreading resistance microscopy and scanning capacitance microscopy Eyben P, Duhayon N, Clarysse I, Vandervorst W Journal of Vacuum Science & Technology B, 21(2), 737, 2003 |
| 4 |
Scanning spreading resistance microscopy and spectroscopy for routine and quantitative two-dimensional carrier profiling Eyben P, Xu M, Duhayon N, Clarysse T, Callewaert S, Vandervorst W Journal of Vacuum Science & Technology B, 20(1), 471, 2002 |
| 5 |
Detailed study of scanning capacitance microscopy on cross-sectional and beveled junctions Duhayon N, Clarysse T, Eyben P, Vandervorst W, Hellemans L Journal of Vacuum Science & Technology B, 20(2), 741, 2002 |