검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
High speed Bias Temperature Instability measurements on 20 nm RMG HKMG MOSFETs Chandra N, Chandrashekhar S, Francis R, Kerber A, Srinivasan P, Nigam T Solid-State Electronics, 101, 18, 2014 |
| No. | Article |
|---|---|
| 1 |
High speed Bias Temperature Instability measurements on 20 nm RMG HKMG MOSFETs Chandra N, Chandrashekhar S, Francis R, Kerber A, Srinivasan P, Nigam T Solid-State Electronics, 101, 18, 2014 |