검색결과 : 38건
| No. | Article |
|---|---|
| 1 |
Thermal atomic layer deposition of AlOxNy thin films for surface passivation of nano-textured flexible silicon Parashar PK, Kinnunen SA, Sajavaara T, Toppari JJ, Komarala VK Solar Energy Materials and Solar Cells, 193, 231, 2019 |
| 2 |
Damage evaluation of proton irradiated titanium deuteride thin films to be used as neutron production targets Anzorena MS, Bertolo AA, Gagetti L, Gaviola PA, del Grosso MF, Kreiner AJ Applied Surface Science, 443, 68, 2018 |
| 3 |
Study of hydrogen storage capacity of Ti induced by ion irradiation Lopez-Suarez A, Garcia-Zuniga N International Journal of Hydrogen Energy, 42(20), 14199, 2017 |
| 4 |
Influence of oxygen impurities on growth morphology, structure and mechanical properties of Ti-Al-N thin films Riedl H, Koller CM, Munnik F, Hutter H, Martin FM, Rachbauer R, Kolozsvari S, Bartosik M, Mayrhofer PH Thin Solid Films, 603, 39, 2016 |
| 5 |
Effect of incorporation of deuterium on vacancy-type defects of a-C:H films prepared by plasma CVD Ozeki K, Sekiba D, Uedono A, Hirakuri KK, Masuzawa T Applied Surface Science, 330, 142, 2015 |
| 6 |
Improvement of titanium hydrogenation by low energy ion irradiation Lopez-Suarez A, Valencia CE, Lopez-Patino J, Vargas MC, Fuentes BE International Journal of Hydrogen Energy, 40(11), 4194, 2015 |
| 7 |
Heavy ion elastic recoil detection analysis of AlxOy/Pt/AlxOy multilayer selective solar absorber Nuru ZY, Msimanga M, Arendse CJ, Maaza M Applied Surface Science, 298, 176, 2014 |
| 8 |
Influence of microstructure on temperature-induced ageing mechanisms of different solar absorber coatings Kotilainen M, Mizohata K, Honkanen M, Vuoristo P Solar Energy Materials and Solar Cells, 120, 462, 2014 |
| 9 |
Influence of the source gas ratio on the hydrogen and deuterium content of a-C:H and a-C:D films: Plasma-enhanced CVD with CH4/H-2, CH4/D-2, CD4/H-2 and CD4/D-2 Ozeki K, Sekiba D, Suzuki T, Kanda K, Niibe M, Hirakuri KK, Masuzawa T Applied Surface Science, 265, 750, 2013 |
| 10 |
Analysis of amorphous-nanocrystalline silicon thin films by time-of-flight elastic recoil detection analysis and high-resolution electron microscopy Gracin D, Siketic Z, Juraic K, Ceh M Applied Surface Science, 275, 19, 2013 |