검색결과 : 2건
No. | Article |
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1 |
Hard-X-ray dark-field imaging using a grating interferometer Pfeiffer F, Bech M, Bunk O, Kraft P, Eikenberry EF, Bronnimann C, Grunzweig C, David C Nature Materials, 7(2), 134, 2008 |
2 |
In situ studies of complex PLD-grown films using hard X-ray surface diffraction Willmott PR, Schleputz CM, Patterson BD, Herger R, Lange A, Meister D, Maden D, Bronnimann C, Eikenberry EF, Hulsen G, Al-Adwan A Applied Surface Science, 247(1-4), 188, 2005 |