화학공학소재연구정보센터
검색결과 : 2건
No. Article
1 Hard-X-ray dark-field imaging using a grating interferometer
Pfeiffer F, Bech M, Bunk O, Kraft P, Eikenberry EF, Bronnimann C, Grunzweig C, David C
Nature Materials, 7(2), 134, 2008
2 In situ studies of complex PLD-grown films using hard X-ray surface diffraction
Willmott PR, Schleputz CM, Patterson BD, Herger R, Lange A, Meister D, Maden D, Bronnimann C, Eikenberry EF, Hulsen G, Al-Adwan A
Applied Surface Science, 247(1-4), 188, 2005