검색결과 : 24건
| No. | Article |
|---|---|
| 1 |
Influence of the spatial distribution of border traps in the capacitance frequency dispersion of Al2O3/InGaAs Palumbo F, Aguirre FL, Pazos SM, Krylov I, Winter R, Eizenberg M Solid-State Electronics, 149, 71, 2018 |
| 2 |
Temperature dependence of trapping effects in metal gates/Al2O3/InGaAs stacks Palumbo F, Pazos S, Aguirre F, Winter R, Krylov I, Eizenberg M Solid-State Electronics, 132, 12, 2017 |
| 3 |
Influence of the oxide-semiconductor interface on the resistive switching phenomenon in metal/Al2O3/InGaAs Palumbo F, Shekhter P, Eizenberg M Solid-State Electronics, 93, 56, 2014 |
| 4 |
Al2O3-SiO2 stack with enhanced reliability Lisiansky M, Fenigstein A, Heiman A, Raskin Y, Roizin Y, Bartholomew L, Owyang J, Gladkikh A, Brener R, Geppert I, Lyakin E, Meyler B, Shnieder Y, Yofis S, Eizenberg M Journal of Vacuum Science & Technology B, 27(1), 476, 2009 |
| 5 |
Copper ion diffusion in porous and nonporous SiO(2)-based dielectrics using bias thermal stress and thermal stress tests Fisher I, Eizenberg M Thin Solid Films, 516(12), 4111, 2008 |
| 6 |
FTIR and ellipsometry characterization of ultra-thin ALD TaN films Wu YY, Eizenberg M Materials Chemistry and Physics, 101(2-3), 269, 2007 |
| 7 |
The contribution of grain boundary scattering versus surface scattering to the resistivity of thin polycrystalline films Marom H, Ritterband M, Eizenberg M Thin Solid Films, 510(1-2), 62, 2006 |
| 8 |
Effects of thermal treatment on structures of Cu/atomic-layer-deposited TaN films/Si stacks Wu YY, Eizenberg M Thin Solid Films, 514(1-2), 33, 2006 |
| 9 |
The role of microstructure in nanocrystalline conformal Co0.9W0.02P0.08 diffusion barriers for copper metallization Kohn A, Eizenberg M, Shacham-Diamand Y Applied Surface Science, 212, 367, 2003 |
| 10 |
Chemical vapor deposited RuOx films: annealing effects Ganesan PG, Shpilman Z, Eizenberg M Thin Solid Films, 425(1-2), 163, 2003 |