검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Elimination of endurance degradation by oxygen annealing in bilayer ZnO/CeO2-x thin films for nonvolatile resistive memory Ismail M, Jabeen S, Akber T, Talib I, Hussain F, Rana AM, Hussain M, Mahmood K, Ahmed E, Bao DH Current Applied Physics, 18(8), 924, 2018 |
| 2 |
Elimination of endurance degradation by oxygen annealing in bilayer ZnO/CeO2-x thin films for nonvolatile resistive memory Ismail M, Jabeen S, Akber T, Talib I, Hussain F, Rana AM, Hussain M, Mahmood K, Ahmed E, Bao DH Current Applied Physics, 18(8), 924, 2018 |
| 3 |
Aggravated test of Intermediate temperature solid oxide fuel cells fed with tar-contaminated syngas Pumiglia D, Vaccaro S, Masi A, McPhail SJ, Falconieri M, Gagliardi S, Della Seta L, Carlini M Journal of Power Sources, 340, 150, 2017 |
| 4 |
Endurance degradation and lifetime model of p-channel floating gate flash memory device with 2T structure Wei JX, Liu SY, Liu XQ, Sun WF, Liu YW, Liu XH, Hou B Solid-State Electronics, 134, 58, 2017 |