검색결과 : 8건
| No. | Article |
|---|---|
| 1 |
Electrical and optical degradation study of methylammonium-based perovskite materials under ambient conditions Marronnier A, Lee H, Lee H, Kim M, Eypert C, Gaston JP, Roma G, Tondelier D, Geffroy B, Bonnassieux Y Solar Energy Materials and Solar Cells, 178, 179, 2018 |
| 2 |
Optical properties of ultrathin CIGS films studied by spectroscopic ellipsometry assisted by chemical engineering Loubat A, Eypert C, Mollica F, Bouttemy M, Naghavi N, Lincot D, Etcheberry A Applied Surface Science, 421, 643, 2017 |
| 3 |
Phase transition in ferroelectric Pb(Zr0.52Ti0.48)O-3 epitaxial thin films Liu Q, Marconot O, Piquemal M, Eypert C, Borowiak AS, Baboux N, Gautier B, Benamrouche A, Rojo-Romeo P, Robach Y, Penuelas J, Vilquin B Thin Solid Films, 553, 85, 2014 |
| 4 |
Electrical properties and interfacial characteristics of RuO2/HfAlOx/SiON/Si and RuO2/LaAlO3/SiON/Si capacitors Edon V, Li Z, Hugon MC, Krug C, Bastos KP, Miotti L, Baumvol IJR, Cardinaud C, Durand O, Eypert C Journal of the Electrochemical Society, 155(9), H661, 2008 |
| 5 |
Optical constants of electroplated Bi2Te3 films by Mueller matrix spectroscopic ellipsometry Zimmer A, Stchakovsky M, Stein N, Johann L, Eypert C, Boulanger C Thin Solid Films, 516(10), 2922, 2008 |
| 6 |
Investigation of lanthanum and hafnium-based dielectric films by X-ray reflectivity, spectroscopic ellipsometry and X-ray photoelectron spectroscopy Edon V, Hugon MC, Agius B, Durand O, Eypert C, Cardinaud C Thin Solid Films, 516(22), 7974, 2008 |
| 7 |
Structural and electrical properties of the interfacial layer in sputter deposited LaAlO3/Si thin films Edon V, Hugon MC, Agius B, Cohen C, Cardinaud C, Eypert C Thin Solid Films, 515(20-21), 7782, 2007 |
| 8 |
Investigation of thermal annealing effects on microstructural and optical properties of HfO2 thin films Modreanu M, Sancho-Parramon J, Durand O, Servet B, Stchakovsky M, Eypert C, Naudin C, Knowles A, Bridou F, Ravet MF Applied Surface Science, 253(1), 328, 2006 |