화학공학소재연구정보센터
검색결과 : 22건
No. Article
1 Metallized nuclear tracks in quasi metal oxide semiconductor structures for electronic devices
Hoppe K, Fink D, Fahrner WR
Journal of the Electrochemical Society, 155(2), P7, 2008
2 Proton damage in amorphous silicon/crystalline silicon heterojunction solar cells
Scherff M, Drzymalla R, Goesse R, Fahrner WR, Ferrara M, Neitzert H, Opitz-Coutureau J, Denker A, Stangl R, Limata B, Gialanella L, Romano M
Journal of the Electrochemical Society, 153(12), G1117, 2006
3 Silicon pyramidal texture formed in pure hydrogen plasma exposure
Huang YL, Ma Y, Job R, Scherff M, Fahrner WR, Shi HG, Xue DS, David ML
Journal of the Electrochemical Society, 152(9), C600, 2005
4 Admittance measurements on a-Si/c-Si heterojunction solar cells
Fahrner WR, Goesse R, Scherff M, Mueller T, Ferrara M, Neitzert HC
Journal of the Electrochemical Society, 152(11), G819, 2005
5 Dependence of hydrogen diffusion on the electric field in p-type silicon
Huang YL, Wdowiak B, Job R, Ma Y, Fahrner WR
Journal of the Electrochemical Society, 151(9), G564, 2004
6 Three-layer structure of hydrogenated Czochralski silicon
Ma Y, Job R, Huang YL, Fahrner WR, Beaufort MF, Barbot JF
Journal of the Electrochemical Society, 151(9), G627, 2004
7 Modelling of a pin-fin heat converter with fluid cooling for power semiconductor modules
Khorunzhii I, Gabor H, Job R, Fahrner WR, Baumann H
International Journal of Energy Research, 27(11), 1015, 2003
8 Magnetic properties of pure Fe-Al2O3 nanocomposites
Xue DS, Huang YL, Ma Y, Zhou PH, Niu ZP, Li FS, Job R, Fahrner WR
Journal of Materials Science Letters, 22(24), 1817, 2003
9 Deep levels in oxygenated n-type high-resistivity FZ silicon before and after a low-temperature hydrogenation step
Simoen E, Claeys C, Job R, Ulyashin AG, Fahrner WR, Tonelli G, De Gryse O, Clauws P
Journal of the Electrochemical Society, 150(9), G520, 2003
10 Investigating contaminants on thermochemically refined surfaces of chemical vapor deposited diamond films
Weima JA, von Borany J, Grotzschel R, Fahrner WR
Journal of the Electrochemical Society, 149(5), G301, 2002