검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Electronic interface properties of silicon substrates after ozone based wet-chemical oxidation studied by SPV measurements Angermann H, Wolke K, Gottschalk C, Moldovan A, Roczen M, Fittkau J, Zimmer M, Rentsch J Applied Surface Science, 258(21), 8387, 2012 |