화학공학소재연구정보센터
검색결과 : 66건
No. Article
1 28 nm FDSOI analog and RF Figures of Merit at N-2 cryogenic temperatures
Esfeh BK, Planes N, Haond M, Raskin JP, Flandre D, Kilchytska V
Solid-State Electronics, 159, 77, 2019
2 Optimisation of rear reflectance in ultra-thin CIGS solar cells towards >20% efficiency
Poncelet O, Kotipalli R, Vermang B, Macleod A, Francis LA, Flandre D
Solar Energy, 146, 443, 2017
3 Addressing the impact of rear surface passivation mechanisms on ultra-thin Cu(In,Ga)Se-2 solar cell performances using SCAPS 1-D model
Kotipalli R, Poncelet O, Li G, Zeng Y, Francis LA, Vermang B, Flandre D
Solar Energy, 157, 603, 2017
4 An in-depth analysis of temperature effect on DIBL in UTBB FD SOI MOSFETs based on experimental data, numerical simulations and analytical models
Pereira ASN, de Steel G, Planes N, Haond M, Giacomini R, Flandre D, Kilchytska V
Solid-State Electronics, 128, 67, 2017
5 RF SOI CMOS technology on 1st and 2nd generation trap-rich high resistivity SOI wafers
Esfeh BK, Makovejev S, Basso D, Desbonnets E, Kilchytska V, Flandre D, Raskin JP
Solid-State Electronics, 128, 121, 2017
6 Role of Ionic Strength in Staphylococcal Cell Aggregation
Vanzieleghem T, Couniot N, Herman-Bausier P, Flandre D, Dufrene YF, Mahillon J
Langmuir, 32(29), 7277, 2016
7 Comparison of self-heating and its effect on analogue performance in 28 nm bulk and FDSOI
Makovejev S, Planes N, Haond M, Flandre D, Raskin JP, Kilchytska V
Solid-State Electronics, 115, 219, 2016
8 A review of special gate coupling effects in long-channel SOI MOSFETs with lightly doped ultra-thin bodies and their compact analytical modeling
Rudenko T, Nazarov A, Kilchytska V, Flandre D
Solid-State Electronics, 117, 66, 2016
9 Assessment of 28 nm UTBB FD-SOI technology platform for RF applications: Figures of merit and effect of parasitic elements
Esfeh BK, Kilchytska V, Barral V, Planes N, Haond M, Flandre D, Raskin JP
Solid-State Electronics, 117, 130, 2016
10 On the improvement of DC analog characteristics of FD SOI transistors by using asymmetric self-cascode configuration
de Souza M, Flandre D, Doria RT, Trevisoli R, Pavanello MA
Solid-State Electronics, 117, 152, 2016