화학공학소재연구정보센터
검색결과 : 3건
No. Article
1 Imaging of thickness and compositional fluctuations in InGaN/GaN quantum wells by scanning capacitance microscopy
Zhou X, Yu ET, Florescu DI, Ramer JC, Lee DS, Ting SM, Armour EA
Journal of Vacuum Science & Technology B, 23(4), 1808, 2005
2 Sapphire substrate misorientation effects on GaN nucleation layer properties
Lu D, Florescu DI, Lee DS, Merai V, Ramer JC, Parekh A, Armour EA
Journal of Crystal Growth, 272(1-4), 353, 2004
3 AFM and temperature-dependent photoluminescence studies of the degree of localization induced by quantum-dot like states in InGaN single quantum well light emitting diodes grown by MOCVD on (0001) sapphire
Florescu DI, Ramer JC, Merai VN, Parekh A, Lu D, Lee DS, Armour EA
Journal of Crystal Growth, 272(1-4), 449, 2004