화학공학소재연구정보센터
검색결과 : 24건
No. Article
1 Nanotechnology and economic resiliency
Fonash SJ
Nano Today, 4(4), 290, 2009
2 Gold nanowires for the detection of elemental and ionic mercury
Keebaugh S, Kalkan AK, Nam WJ, Fonash SJ
Electrochemical and Solid State Letters, 9(9), H88, 2006
3 Dendritic aggregation of oligothiophene during desorption of 2,5-diiodothiophene multilayer and topography-induced alignment of oligothiophene nanofibers
Liu GM, Rider KB, Nam WJ, Fonash SJ, Kim SH
Journal of Physical Chemistry B, 110(41), 20197, 2006
4 Electroless synthesis of Ag nanoparticles on deposited nanostructured Si films
Kalkan AK, Fonash SJ
Journal of Physical Chemistry B, 109(44), 20779, 2005
5 Fabrication and evaluation of highly manufacturable nanoscale flow-through parallel electrode structures
Nam WJ, Fonash SJ, Cuiffi JD
Journal of Vacuum Science & Technology B, 22(6), L35, 2004
6 Formation of nanostructured polymer filaments in nanochannels
Peng CY, Nam WJ, Fonash SJ, Gu B, Sen A, Strawhecker K, Natarajan S, Foley HC, Kim SH
Journal of the American Chemical Society, 125(31), 9298, 2003
7 Electrical properties of the gate oxide and its interface with Si in U-shaped trench MOS capacitors: The impact of polycrystalline Si doping and oxide composition
Suliman SA, Venkataraman B, Wu CT, Ridley RS, Dolny GM, Awadelkarim OO, Fonash SJ, Ruzyllo J
Solid-State Electronics, 47(5), 899, 2003
8 Electron and hole trapping in the bulk and interface with Si of a thermal oxide grown on the sidewalls and base of a U-shaped silicon trench
Suliman SA, Awadelkarim OO, Fonash SJ, Ridley RS, Dolny GM, Hao J, Knoedler CM
Solid-State Electronics, 46(6), 837, 2002
9 Nano- and microchannel fabrication using column/void network deposited silicon
Nam WJ, Bae S, Kalkan AK, Fonash SJ
Journal of Vacuum Science & Technology A, 19(4), 1229, 2001
10 The effects of channel boron-doping on the performance and hot electron reliability of N-channel trend UMOSFETs
Suliman SA, Awadelkarim OO, Fonash SJ, Dolny GM, Hao J, Ridley RS, Knoedler CM
Solid-State Electronics, 45(5), 655, 2001