검색결과 : 1건
No. | Article |
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1 |
Critical-dimension control for 100 nm patterns in x-ray lithography Tanaka Y, Iwamoto T, Fujii K, Kikuchi Y, Matsui Y, Fukuda M, Morita H Journal of Vacuum Science & Technology B, 17(6), 3415, 1999 |
No. | Article |
---|---|
1 |
Critical-dimension control for 100 nm patterns in x-ray lithography Tanaka Y, Iwamoto T, Fujii K, Kikuchi Y, Matsui Y, Fukuda M, Morita H Journal of Vacuum Science & Technology B, 17(6), 3415, 1999 |