검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Physical model and numerical results of dissociation kinetics of hydrogen-passivated Si/SiO2 interface defects Gadiyak GV Thin Solid Films, 350(1-2), 147, 1999 |
| 2 |
Model and computer simulation results of defect transformation and decomposition of SiNx : H films during high temperature treatment Gadiyak GV, Gadiyak VG, Kosinova ML, Salman EG Thin Solid Films, 335(1-2), 19, 1998 |