검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Thickness determination of SrZrO3 thin films using both X-ray reflectometry and SIMS techniques Galicka-Fau K, Legros C, Andrieux M, Herbst-Ghysel M, Gallet I, Condat M, Durand O, Servet B Thin Solid Films, 516(22), 7967, 2008 |
| 2 |
Perovskite thin films grown by direct liquid injection MOCVD Andrieux M, Gasqueres C, Legros C, Gallet I, Herbst-Ghysel M, Condat M, Kessler VG, Seisenbaeva GA, Heintz O, Poissonnet S Applied Surface Science, 253(23), 9091, 2007 |
| 3 |
Stress driven phase transformation in ZrO2 film Benali B, Ghysel MH, Gallet I, Huntz AM, Andrieux M Applied Surface Science, 253(3), 1222, 2006 |