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| No. | Article |
|---|---|
| 1 |
Gamma and proton irradiation effects and thermal stability of electrical characteristics of metal-oxide-silicon capacitors with atomic layer deposited Al2O3 dielectric Rafi JM, Pellegrini G, Fadeyev V, Galloway Z, Sadrozinski HFW, Christophersen M, Phlips BF, Lynn D, Kierstead J, Hoeferkamp M, Gorelov I, Palni P, Wang R, Seidel S Solid-State Electronics, 116, 38, 2016 |