검색결과 : 2건
No. | Article |
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1 |
Growth and characterization of nitrogen-phosphorus hybrid passivated gate oxide film on N-type 4H-SiC epilayer Jia YF, Lv HL, Tang XY, Han C, Song QW, Zhang YM, Zhang YM, Dimitrijev S, Han JS Journal of Crystal Growth, 507, 98, 2019 |
2 |
FT-IR-ATR study of depth profile of SiO2 ultra-thin films Nagai N, Hashimoto H Applied Surface Science, 172(3-4), 307, 2001 |