검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
The impact of gate to drain spacing on hot-carrier degradation in sub-100 nm Ni-Pt salicidation FinFETs Lee SM, Lee HD, Ok I, Oh J Solid-State Electronics, 114, 167, 2015 |
| No. | Article |
|---|---|
| 1 |
The impact of gate to drain spacing on hot-carrier degradation in sub-100 nm Ni-Pt salicidation FinFETs Lee SM, Lee HD, Ok I, Oh J Solid-State Electronics, 114, 167, 2015 |