검색결과 : 24건
| No. | Article |
|---|---|
| 1 |
Electrical properties of Molecular Beam Epitaxy grown Barium Titanate probed by conductive Atomic Force Microscopy Martin S, Baboux N, Albertini D, Gautier B Thin Solid Films, 642, 324, 2017 |
| 2 |
Nanoscale study of perovskite BiFeO3/spinel (Fe,Zn)(3)O-4 co-deposited thin film by electrical scanning probe methods Borowiak AS, Okada K, Kanki T, Gautier B, Vilquin B, Tanaka H Applied Surface Science, 351, 531, 2015 |
| 3 |
Imaging by atomic force microscopy of the properties difference of the layers covering the facets created during SIMS analysis Fares B, Gautier B, Albertini D, Mzerd A, Loghmarti M Applied Surface Science, 308, 24, 2014 |
| 4 |
Chemistry and structure of BaTiO3 ultra-thin films grown by different O-2 plasma power Wang JL, Leroy J, Niu G, Saint-Girons G, Gautier B, Vilquin B, Barrett N Chemical Physics Letters, 592, 206, 2014 |
| 5 |
Phase transition in ferroelectric Pb(Zr0.52Ti0.48)O-3 epitaxial thin films Liu Q, Marconot O, Piquemal M, Eypert C, Borowiak AS, Baboux N, Gautier B, Benamrouche A, Rojo-Romeo P, Robach Y, Penuelas J, Vilquin B Thin Solid Films, 553, 85, 2014 |
| 6 |
Epitaxial growth and electrical measurement of single crystalline Pb(Zr0.52Ti0.48)O-3 thin film on Si(001) for micro-electromechanical systems Yin S, Niu G, Vilquin B, Gautier B, Le Rhun G, Defay E, Robach Y Thin Solid Films, 520(14), 4572, 2012 |
| 7 |
Molecular beam epitaxy growth of BaTiO3 thin films and crucial impact of oxygen content conditions on the electrical characteristics Niu G, Gautier B, Yin S, Saint-Girons G, Lecoeur P, Pillard V, Hollinger G, Vilquin B Thin Solid Films, 520(14), 4595, 2012 |
| 8 |
Pulsed laser deposition of epitaxial ferroelectric Pb(Zr,Ti)O-3 films on silicon substrates Borowiak AS, Niu G, Pillard V, Agnus G, Lecoeur P, Albertini D, Baboux N, Gautier B, Vilquin B Thin Solid Films, 520(14), 4604, 2012 |
| 9 |
Nanoscale leakage current measurements in metal organic chemical vapor deposition crystalline SrTiO3 films Rozier Y, Gautier B, Hyvert G, Descamps A, Plossu C, Dubourdieu C, Ducroquet F Thin Solid Films, 517(6), 1868, 2009 |
| 10 |
Interpretation of scanning capacitance microscopy for thin oxides characterization Ligor O, Gautier B, Descamps-Mandine A, Albertini D, Baboux N, Militaru L Thin Solid Films, 517(24), 6721, 2009 |