검색결과 : 11건
| No. | Article |
|---|---|
| 1 |
Forming operation in Ge-rich GexSbyTez phase change memories Palumbo E, Zuliani P, Borghi M, Annunziata R Solid-State Electronics, 133, 38, 2017 |
| 2 |
Comparative study on crystallization characteristics of amorphous Ge2Sb2Te5 films by an ultraviolet laser radiation and isothermal annealing Zhu Z, Liu FR, Wang ZM, Fan ZK, Liu F, Sun NX Applied Surface Science, 335, 184, 2015 |
| 3 |
Engineering of chalcogenide materials for embedded applications of Phase Change Memory Zuliani P, Palumbo E, Borghi M, Libera GD, Annunziata R Solid-State Electronics, 111, 27, 2015 |
| 4 |
A study on the crystallization behavior of Sn-doped amorphous Ge2Sb2Te5 by ultraviolet laser radiation Bai N, Liu FR, Han XX, Zhu Z, Liu F, Lin X, Sun NX Applied Surface Science, 316, 202, 2014 |
| 5 |
Impact of Ge-Sb-Te compound engineering on the set operation performance in phase-change memories Boniardi M, Ielmini D, Tortorelli I, Redaelli A, Pirovano A, Allegra M, Magistretti M, Bresolin C, Erbetta D, Modelli A, Varesi E, Pellizzer F, Lacaita AL, Bez R Solid-State Electronics, 58(1), 11, 2011 |
| 6 |
Novel preparation methods of electrical contacts in Ge-Sb-Te thin alms Mahmoud ST, Ghamlouche H, Qamhieh N, Al-Shamisi H Applied Surface Science, 253(17), 7242, 2007 |
| 7 |
Study of laser crystallization and recording properties of oxygen doped Ge : Sb : Te films Rivera-Rodriguez C, Prokhorov E, Kovalenko Y, Morales-Sanchez E, Gonzalez-Hernandez J Applied Surface Science, 247(1-4), 545, 2005 |
| 8 |
Observation of the cascaded phase transformation of Ge-Sb-Te alloy at elevated temperature by using nanosecond time resolved ellipsometry Kim SJ, Park YD, An SH, Kim SY Thin Solid Films, 455-56, 675, 2004 |
| 9 |
Deposition and characterization of Ge-Sb-Te layers for applications in optical data storage Kyrsta S, Cremer R, Neuschutz D, Laurenzis M, Bolivar PH, Kurz H Applied Surface Science, 179(1-4), 55, 2001 |
| 10 |
Morphology and structure of laser-modified Ge2Sb2Te5 films studied by transmission electron microscopy Friedrich I, Weidenhof V, Lenk S, Wuttig M Thin Solid Films, 389(1-2), 239, 2001 |