화학공학소재연구정보센터
검색결과 : 2건
No. Article
1 Oxidation-induced crystallographic transformation in heavily N-doped 4H-SiC wafers
Skromme BJ, Palle K, Poweleit CD, Bryant LR, Vetter WM, Dudley M, Moore K, Gehoski T
Materials Science Forum, 389-3, 455, 2002
2 Fermi level pinning and Schottky barrier characteristics on reactively ion etched 4H-SiC
Skromme BJ, Luckowski E, Moore K, Clemens S, Resnick D, Gehoski T, Ganser D
Materials Science Forum, 338-3, 1029, 2000