검색결과 : 14건
| No. | Article |
|---|---|
| 1 |
Dynamics of Colloids in Single Solid-State Nanopores Bacri L, Oukhaled AG, Schiedt B, Patriarche G, Bourhis E, Gierak J, Pelta J, Auvray L Journal of Physical Chemistry B, 115(12), 2890, 2011 |
| 2 |
Development of ion sources from ionic liquids for microfabrication Perez-Martinez C, Guilet S, Gogneau N, Jegou P, Gierak J, Lozano P Journal of Vacuum Science & Technology B, 28(3), L25, 2010 |
| 3 |
Production of noble gas ion beams in a focused ion beam machine using an electron beam ion trap Ullmann F, Grossmann F, Ovsyannikov VP, Gierak J, Bourhis E, Ferre J, Jamet JP, Mougin A, Zschornack G Journal of Vacuum Science & Technology B, 25(6), 2162, 2007 |
| 4 |
Functionalizing surfaces with arrays of clusters: role of the defects Melinon P, Hannour A, Prevel B, Bardotti L, Bernstein E, Perez A, Gierak J, Bourhis E, Mailly D Journal of Crystal Growth, 275(1-2), 317, 2005 |
| 5 |
STM and FIB nano-structuration of surfaces to localise InAs/InP(001) quantum dots Kapsa J, Robach Y, Hollinger G, Gendry M, Gierak J, Mailly D Applied Surface Science, 226(1-3), 31, 2004 |
| 6 |
Gold nanoparticle arrays on graphite surfaces Prevel B, Bardotti L, Fanget S, Hannour A, Melinon P, Perez A, Gierak J, Faini G, Bourhis E, Mailly D Applied Surface Science, 226(1-3), 173, 2004 |
| 7 |
Organizing nanoclusters on functionalized surfaces Bardotti L, Prevel B, Jensen P, Treilleux M, Melinon P, Perez A, Gierak J, Faini G, Mailly D Applied Surface Science, 191(1-4), 205, 2002 |
| 8 |
Focused ion beam patterning of III-V crystals at low temperature: A method for improving the ion-induced defect localization Schneider M, Gierak J, Marzin JY, Gayral B, Gerard JM Journal of Vacuum Science & Technology B, 18(6), 3162, 2000 |
| 9 |
Very high-resolution focused ion beam nanolithography improvement: A new three-dimensional patterning capability Gierak J, Cambril E, Schneider M, David C, Mailly D, Flicstein J, Schmid G Journal of Vacuum Science & Technology B, 17(6), 3132, 1999 |
| 10 |
Evidence of depth and lateral diffusion of defects during focused ion beam implantation Vieu C, Gierak J, Schneider M, Ben Assayag G, Marzin JY Journal of Vacuum Science & Technology B, 16(4), 1919, 1998 |