| 1 |
Hierarchical flower-like SrHPO4 electrodes for the photoelectrochemical degradation of Rhodamine B
Amaterz E, Tara A, Bouddouch A, Taoufyq A, Bakiz B, Lazar F, Gilliot M, Benlhachemi A, Bazzi L, Jbara O
Journal of Applied Electrochemistry, 50(5), 569, 2020 |
| 2 |
Formation of nanogranular ZnO ultrathin films and estimation of their performance for photocatalytic degradation of amoxicillin antibiotic
Boussatha N, Gilliot M, Ghoualem H, Martin J
Materials Research Bulletin, 99, 485, 2018 |
| 3 |
Spectroscopic ellipsometry data inversion using constrained splines and application to characterization of ZnO with various morphologies
Gilliot M, Hadjadj A, Stchakovsky M
Applied Surface Science, 421, 453, 2017 |
| 4 |
Correlated effects of preparation parameters and thickness on morphology and optical properties of ZnO very thin films
Gilliot M, Hadjadj A
Journal of Crystal Growth, 423, 38, 2015 |
| 5 |
Investigation of the correlation between dielectric function, thickness and morphology of nano-granular ZnO very thin films
Gilliot M, Hadjadj A, Martin J
Thin Solid Films, 597, 65, 2015 |
| 6 |
Theory of dual-rotating polarizer and analyzer ellipsometer
Gilliot M, Naciri AE
Thin Solid Films, 540, 46, 2013 |
| 7 |
Errors in inversion of ellipsometric equations for transparent films
Gilliot M
Thin Solid Films, 542, 300, 2013 |
| 8 |
Extraction of complex refractive index of absorbing films from ellipsometry measurement
Gilliot M
Thin Solid Films, 520(17), 5568, 2012 |
| 9 |
Use of Voigt oscillators to characterize microelectronics materials by Infrared Spectroscopic Ellipsometry
Gilliot M, Piel JP
Thin Solid Films, 516(22), 7996, 2008 |
| 10 |
Application of spectroscopic ellipsometry to the investigation of the optical properties of cobalt-nanostructured silica thin layers
Gilliot M, Naciri AE, Johann L, d'Orleans C, Muller D, Stoquert JP, Grob JJ
Applied Surface Science, 253(1), 389, 2006 |
