검색결과 : 2건
No. | Article |
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1 |
Electrical characterization of FIB processed metal layers for reliable conductive-AFM on ZnO microstructures Pea M, Maiolo L, Giovine E, Rinaldi A, Araneo R, Notargiacomo A Applied Surface Science, 371, 83, 2016 |
2 |
RF power performance evaluation of surface channel diamond MESFETs Camarchia V, Cappelluti F, Ghione G, Rossi MC, Calvani P, Conte G, Pasciuto B, Limiti E, Dominijanni D, Giovine E Solid-State Electronics, 55(1), 19, 2011 |