화학공학소재연구정보센터
검색결과 : 55건
No. Article
1 High-resolution mapping of infraslow cortical brain activity enabled by graphene microtransistors
Masvidal-Codina E, Illa X, Dasilva M, Calia AB, Dragojevic T, Vidal-Rosass EE, Prats-Alfonso E, Martinez-Aguilar J, De la Cruz JM, Garcia-Cortadella R, Godignon P, Rius G, Camassa A, Del Corro E, Bousquet J, Hebert C, Durduran T, Villa R, Sanchez-Vives MV, Garrido JA, Guimera-Brunet A
Nature Materials, 18(3), 280, 2019
2 High-resolution mapping of infraslow cortical brain activity enabled by graphene microtransistors
Masvidal-Codina E, Illa X, Dasilva M, Calia AB, Dragojevic T, Vidal-Rosass EE, Prats-Alfonso E, Martinez-Aguilar J, De la Cruz JM, Garcia-Cortadella R, Godignon P, Rius G, Camassa A, Del Corro E, Bousquet J, Hebert C, Durduran T, Villa R, Sanchez-Vives MV, Garrido JA, Guimera-Brunet A
Nature Materials, 18(3), 280, 2019
3 Local non invasive study of SiC diodes with abnormal electrical behavior
Leon J, Perpina X, Vellvehi M, Jorda X, Godignon P
Solid-State Electronics, 113, 35, 2015
4 Effect of the Growth Conditions on the Properties of Nitrided Oxides Grown by RTP for 4H-SiC p-Channel MOSFETs Fabrication
Constant A, Berthou M, Florentin M, Millan J, Godignon P
Journal of the Electrochemical Society, 159(5), H516, 2012
5 Optical nano-imaging of gate-tunable graphene plasmons
Chen JN, Badioli M, Alonso-Gonzalez P, Thongrattanasiri S, Huth F, Osmond J, Spasenovic M, Centeno A, Pesquera A, Godignon P, Elorza AZ, Camara N, de Abajo FJG, Hillenbrand R, Koppens FHL
Nature, 487(7405), 77, 2012
6 Rapid Growth of Oxide Films on SiC by Photo-Assisted Mechanism
Constant A, Camara N, Montserrat J, Camassel J, Godignon P
Electrochemical and Solid State Letters, 14(6), G42, 2011
7 Interfacial Properties of Oxides Grown on 3C-SiC by Rapid Thermal Processing
Constant A, Camara N, Placidi M, Decams JM, Camassel J, Godignon P
Journal of the Electrochemical Society, 158(1), G13, 2011
8 Fabrication of PPF Electrodes by a Rapid Thermal Process
del Campo FJ, Godignon P, Aldous L, Pausas E, Sarrion M, Zabala M, Prehn R, Compton RG
Journal of the Electrochemical Society, 158(1), H63, 2011
9 Observation and characterization of near-interface oxide traps in 3C-SiC MOS structures by quasi-static I-V method
Constant A, Godignon P
Solid-State Electronics, 63(1), 70, 2011
10 Effects of Photons on 4H-SiC Rapid Thermal Oxidation Using Nitrous Oxide Gas
Constant A, Camara N, Godignon P, Placidi M, Perez-Tomas A, Camassel J
Journal of the Electrochemical Society, 157(6), G136, 2010