검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Oxidation kinetics of Ni metallic films: Formation of NiO-based resistive switching structures Courtade L, Turquat C, Muller C, Lisoni JG, Goux L, Wouters DJ, Goguenheim D, Roussel P, Ortega L Thin Solid Films, 516(12), 4083, 2008 |
| 2 |
Determination of the electrical properties of ultrathin silicon-based dielectric films: thermally grown SiNx Pic N, Glachant A, Nitsche S, Hoarau JY, Goguenheim D, Vuillaume D, Sibai A, Chaneliere C Solid-State Electronics, 45(8), 1265, 2001 |
| 3 |
Comparison of oxide leakage currents induced by ion implantation and high field electric stress Goguenheim D, Bravaix A, Monserie C, Moragues JM, Lambert P, Boivin P Solid-State Electronics, 45(8), 1355, 2001 |