검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Precision Transmission Electron-Microscopy Sample Preparation Using a Focused Ion-Beam by Extraction Method Sheng TT, Goh GP, Tung CH, Wang LF Journal of Vacuum Science & Technology B, 15(3), 610, 1997 |
| No. | Article |
|---|---|
| 1 |
Precision Transmission Electron-Microscopy Sample Preparation Using a Focused Ion-Beam by Extraction Method Sheng TT, Goh GP, Tung CH, Wang LF Journal of Vacuum Science & Technology B, 15(3), 610, 1997 |