검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Oxygen precipitation behavior in 300 mm polished Czochralski silicon wafers Ono T, Rozgonyi GA, Au C, Messina T, Goodall RK, Huff HR Journal of the Electrochemical Society, 146(10), 3807, 1999 |
| 2 |
Measurement of Silicon Particles by Laser-Surface Scanning and Angle-Resolved Light-Scattering Huff HR, Goodall RK, Williams E, Woo KS, Liu BY, Warner T, Hirleman D, Gildersleeve K, Bullis WM, Scheer BW, Stover J Journal of the Electrochemical Society, 144(1), 243, 1997 |