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| No. | Article |
|---|---|
| 1 |
Test methods for measuring bulk copper and nickel in heavily doped p-type silicon wafers Fabry L, Hoelzl R, Andrukhiv A, Matsumoto K, Qiu J, Koveshnikov S, Goldstein M, Grabau A, Horie H, Takeda R Journal of the Electrochemical Society, 153(6), G566, 2006 |