검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Weibull fracture probability for silicon wafer bond evaluation Kohler J, Jonsson K, Greek S, Stenmark L Journal of the Electrochemical Society, 147(12), 4683, 2000 |
| 2 |
In-Situ Tensile-Strength Measurement and Weibull Analysis of Thick-Film and Thin-Film Micromachined Polysilicon Structures Greek S, Ericson F, Johansson S, Schweitz JA Thin Solid Films, 292(1-2), 247, 1997 |