검색결과 : 22건
| No. | Article |
|---|---|
| 1 |
Secondary ion mass spectrometry characterization of anomalous behavior for low dose ion implanted phosphorus in silicon Penley C, Stevie FA, Griffis DP, Siebel S, Kulig L, Lee J Journal of Vacuum Science & Technology B, 28(3), 511, 2010 |
| 2 |
Model study of electron beam charge compensation for positive secondary ion mass spectrometry using a positive primary ion beam Zhu ZM, Stevie FA, Griffis DP Applied Surface Science, 254(9), 2708, 2008 |
| 3 |
Quantification in dynamic SIMS: Current status and future needs Stevie FA, Griffis DP Applied Surface Science, 255(4), 1364, 2008 |
| 4 |
Mass fractionation of carbon and hydrogen secondary ions upon Cs+ and O-2(+) bombardment of organic materials Harton SE, Zhu ZM, Stevie FA, Griffis DP, Ade H Journal of Vacuum Science & Technology A, 25(3), 480, 2007 |
| 5 |
Improved understanding of an electron beam charge compensation method for magnetic sector secondary ion mass spectrometer analysis of insulators Zhu Z, Gu C, Stevie FA, Griffis DP Journal of Vacuum Science & Technology A, 25(4), 769, 2007 |
| 6 |
Back side SIMS analysis of hafnium silicate Gu C, Stevie FA, Bennett J, Garcia R, GriffiS DP Applied Surface Science, 252(19), 7179, 2006 |
| 7 |
SIMS depth profiling of deuterium labeled polymers in polymer multilayers Harton SE, Stevie FA, Griffis DP, Ade H Applied Surface Science, 252(19), 7224, 2006 |
| 8 |
SIMS quantification of matrix and impurity species in AlxGa1-xN Gu CJ, Stevie FA, Hitzman CJ, Saripalli YN, Johnson M, Griffis DP Applied Surface Science, 252(19), 7228, 2006 |
| 9 |
Improved charge neutralization method for depth profiling of bulk insulators using O-2(+) primary beam on a magnetic sector SIMS instrument Pivovarov AL, Stevie FA, Griffis DP Applied Surface Science, 231-2, 786, 2004 |
| 10 |
Optimization of secondary ion mass spectrometry detection limit for N in SiC Pivovarov AL, Stevie FA, Griffis DP, Guryanov GM Journal of Vacuum Science & Technology A, 21(5), 1649, 2003 |