화학공학소재연구정보센터
검색결과 : 15건
No. Article
1 Electrostatic Coupling and Identification of Single-Defects in GaN/AlGaN Fin-MIS-HEMTs
Grill A, Stampfer B, Im KS, Lee JH, Ostermaier C, Ceric H, Waltl M, Grasser T
Solid-State Electronics, 156, 41, 2019
2 Long-term hydrogen storage in Mg and ZK60 after Severe Plastic Deformation
Grill A, Horky J, Panigrahi A, Krexner G, Zehetbauer M
International Journal of Hydrogen Energy, 40(47), 17144, 2015
3 Dynamic modeling and optimal control strategy of waste heat recovery Organic Rankine Cycles
Quoilin S, Aumann R, Grill A, Schuster A, Lemort V, Spliethoff H
Applied Energy, 88(6), 2183, 2011
4 Wafer-Scale Graphene Integrated Circuit
Lin YM, Valdes-Garcia A, Han SJ, Farmer DB, Meric I, Sun YN, Wu YQ, Dimitrakopoulos C, Grill A, Avouris P, Jenkins KA
Science, 332(6035), 1294, 2011
5 Silane Decomposition on Cu Interconnects Inhibited by Ammonia
Ryan ET, Molis S, Grill A
Journal of the Electrochemical Society, 157(1), H78, 2010
6 Wafer-scale epitaxial graphene growth on the Si-face of hexagonal SiC (0001) for high frequency transistors
Dimitrakopoulos C, Lin YM, Grill A, Farmer DB, Freitag M, Sun YN, Han SJ, Chen ZH, Jenkins KA, Zhu Y, Liu ZH, McArdle TJ, Ott JA, Wisnieff R, Avouris P
Journal of Vacuum Science & Technology B, 28(5), 985, 2010
7 100-GHz Transistors from Wafer-Scale Epitaxial Graphene
Lin YM, Dimitrakopoulos C, Jenkins KA, Farmer DB, Chiu HY, Grill A, Avouris P
Science, 327(5966), 662, 2010
8 Adjusting the Skeleton and Pore Structure of Porous SiCOH Dielectrics
Gates SM, Dubois G, Ryan ET, Grill A, Liu M, Gidley D
Journal of the Electrochemical Society, 156(10), G156, 2009
9 Line resistance and electromigration variations induced by hydrogen-based plasma modifications to the silicon carbonitride/copper interface
Ryan ET, Martin J, Bonilla G, Molis S, Spooner T, Widodo J, Kim JH, Liniger E, Grill A, Hu CK
Journal of the Electrochemical Society, 154(7), H604, 2007
10 The effect of plasma chemistry on the damage induced to porous SiCOH dielectrics
Grill A, Patel V
Journal of the Electrochemical Society, 153(8), F169, 2006