검색결과 : 22건
No. | Article |
---|---|
1 |
Study of the surface state density and potential in MIS diode Schottky using the surface photovoltage method Kacha AH, Akkal B, Benamara Z, Robert-Goumet C, Monier G, Gruzza B Molecular Crystals and Liquid Crystals, 627(1), 66, 2016 |
2 |
XPS combined with MM-EPES technique for in situ study of ultra thin film deposition: Application to an Au/SiO2/Si structure Mahjoub MA, Monier G, Robert-Goumet C, Bideux L, Gruzza B Applied Surface Science, 357, 1268, 2015 |
3 |
First stages of surface steel nitriding: X-ray photoelectron spectroscopy and electrical measurements Flori M, Gruzza B, Bideux L, Monier G, Robert-Goumet C, Benamara Z Applied Surface Science, 255(22), 9206, 2009 |
4 |
XPS study of the O-2/SF6 microwave plasma oxidation of (001) GaAs surfaces Monier G, Bideux L, Desplats O, Fontaine C, Robert-Goumet C, Gruzza B Applied Surface Science, 256(1), 56, 2009 |
5 |
Growth study of thin indium nitride layers on InP (100) by Auger electron spectroscopy and photoluminescence Ben Khalifa S, Saidi F, Gruzza B, Robert-Goumet C, Bideux L, Hassen F, Maaref H Journal of Crystal Growth, 311(9), 2608, 2009 |
6 |
Electrical properties of gallium arsenide surfaces and interfaces treated by Ru(3+) ions Mazari H, Benamara Z, Ameur K, Benseddik N, Bonnaud O, Olier R, Gruzza B Materials Chemistry and Physics, 118(1), 1, 2009 |
7 |
XPS study of the formation of ultrathin GaN film on GaAs(100) Bideux L, Monier G, Matolin V, Robert-Goumet C, Gruzza B Applied Surface Science, 254(13), 4150, 2008 |
8 |
Study of the 42CrMo4 steel surface by quantitative XPS electron spectroscopy Flori M, Gruzza B, Bideux L, Monier G, Robert-Goumet C Applied Surface Science, 254(15), 4738, 2008 |
9 |
Combined EELS, LEED and SR-XPS study of ultra-thin crystalline layers of indium nitride on InP(100) - Effect of annealing at 450 degrees C Robert-Goumet C, Petit M, Bideux L, Gruzza B, Monier G, Matolin V, Skala T, Tsud N, Prince KC Applied Surface Science, 253(9), 4445, 2007 |
10 |
XPS, electric and photoluminescence-based analysis of the GaAs (100) nitridation Benamara Z, Mecirdi N, Bouiadjra BB, Bideux L, Gruzza B, Robert C, Miczek M, Adamowicz B Applied Surface Science, 252(22), 7890, 2006 |