검색결과 : 2건
No. | Article |
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1 |
Hysteresis in metal insulator semiconductor structures with high temperature annealed ZrO2/SiOx layers Gueorguiev VK, Aleksandrova PV, Ivanov TE, Koprinarova JB Thin Solid Films, 517(5), 1815, 2009 |
2 |
TEM structural characterization of Sn-Te-O thin films on monocrystalline silicon wafers Popova LI, Peneva SK, Dimitriadis CA, Gueorguiev VK, Andreev SK Thin Solid Films, 441(1-2), 25, 2003 |