1 |
Elaboration of tin oxide nano-islands through post-deposition thermal treatment Thune E, Hamd W, Pons A, Tseng J, Guinebretiere R Thin Solid Films, 562, 200, 2014 |
2 |
Size&Strain VI Preface Thomas O, Guinebretiere R Thin Solid Films, 530, 1, 2013 |
3 |
Properties of LiNbO3 based heterostructures grown by pulsed-laser deposition for optical waveguiding application Kilburger S, Millon E, Di Bin P, Boulle A, Guinebretiere R, Di Bin C Thin Solid Films, 518(16), 4654, 2010 |
4 |
Nanostructured sapphire vicinal surfaces as templates for the growth of self-organized oxide nanostructures Thune E, Boulle A, Babonneau D, Pailloux F, Hamd W, Guinebretiere R Applied Surface Science, 256(3), 924, 2009 |
5 |
Microstructural study of SnO2 thin layers deposited on sapphire by sol-gel dip-coating Hamd W, Wu YC, Boulle A, Thune E, Guinebretiere R Thin Solid Films, 518(1), 1, 2009 |
6 |
Growth of LiNbO3 thin films on sapphire by pulsed-laser deposition for electro-optic modulators Kilburger S, Chety R, Millon E, Di Bin P, Di Bin C, Boulle A, Guinebretiere R Applied Surface Science, 253(19), 8263, 2007 |
7 |
Two-dimensional versus three-dimensional post-deposition grain growth in epitaxial oxide thin films Influence of the substrate surface roughness Bachelet R, Boulle A, Soulestin B, Rossignol F, Guinebretiere R, Dauger A Thin Solid Films, 515(18), 7080, 2007 |
8 |
Recent advances in high-resolution X-ray diffractometry applied to nanostructured oxide thin films: The case of yttria stabilized zirconia epitaxially grown on sapphire Boulle A, Guinebretiere R, Masson O, Bachelet R, Conchon F, Dauger A Applied Surface Science, 253(1), 95, 2006 |
9 |
Strain profiles in yttria stabilized zirconia epitaxial thin films determined by high-resolution X-ray diffraction Boulle A, Masson O, Guinebretiere R, Dauger A Thin Solid Films, 450(1), 66, 2004 |
10 |
Defect structure of pulsed laser deposited LiNbO3/Al2O3 layers determined by X-ray diffraction reciprocal space mapping Boulle A, Canale L, Guinebretiere R, Girault-Di Bin C, Dauger A Thin Solid Films, 429(1-2), 55, 2003 |