검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Determination of the thickness distribution of a graphene layer grown on a 2'' SiC wafer by means of Auger electron spectroscopy depth profiling Gurban S, Pecz B, Menyhard M, Yakimova R Applied Surface Science, 316, 301, 2014 |
| 2 |
Growth of amorphous SiC film on Si by means of ion beam induced mixing Barna A, Gurban S, Kotis L, Labar J, Sulyok A, Toth AL, Menyhard M, Kovac J, Panjan P Applied Surface Science, 263, 367, 2012 |
| 3 |
Surface excitation effects in electron spectroscopy Gergely G, Menyhard M, Gurban S, Sulyok A, Toth J, Varga D, Tougaard S Solid State Ionics, 141-142, 47, 2001 |