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| No. | Article |
|---|---|
| 1 |
Development of nanotopography during SIMS characterization of thin films of Ge1-xSnx alloy Secchi M, Demenev E, Colaux JL, Giubertoni D, Dell'Anna R, Iacob E, Gwilliam M, Jeynes C, Bersani M Applied Surface Science, 356, 422, 2015 |