화학공학소재연구정보센터
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No. Article
1 X-ray diffraction analysis of thermally-induced stress relaxation in ZnO films deposited by magnetron sputtering on (100) Si substrates
Conchon F, Renault PO, Goudeau P, Le Bourhis E, Sondergard E, Barthel E, Grachev S, Gouardes E, Rondeau V, Gy R, Lazzari R, Jupille J, Brun N
Thin Solid Films, 518(18), 5237, 2010
2 X-ray diffraction study of thermal stress relaxation in ZnO films deposited by magnetron sputtering
Conchon F, Renault PO, Le Bourhis E, Krauss C, Goudeau P, Barthel E, Grachev SY, Sondergard E, Rondeau V, Gy R, Lazzari R, Jupille J, Brun N
Thin Solid Films, 519(5), 1563, 2010
3 Residual stresses near holes in tempered glass plates
Daudeville L, Bernard F, Gy R
Materials Science Forum, 404-7, 43, 2002
4 Multiaxial Linear Viscoelastic Behavior of a Soda-Lime-Silica Glass Based on a Generalized Maxwell Model
Duffrene L, Gy R, Burlet H, Piques R
Journal of Rheology, 41(5), 1021, 1997
5 Generalized Maxwell model for the viscoelastic behavior of a soda-lime-silica glass under low frequency shear loading
Duffrene L, Gy R, Burlet H, Piques R, Faivre A, Sekkat A, Perez J
Rheologica Acta, 36(2), 173, 1997