검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Performance, reliability, radiation effects, and aging issues in microelectronics - From atomic-scale physics to engineering-level modeling Pantelides ST, Tsetseris L, Beck MJ, Rashkeev SN, Hadjisavvas G, Batyrev IG, Tuttle BR, Marinopoulos AG, Zhou XJ, Fleetwood DM, Schrimpf RD Solid-State Electronics, 54(9), 841, 2010 |