화학공학소재연구정보센터
검색결과 : 22건
No. Article
1 Reduction of the dislocation density in HVPE-grown GaN epi-layers by an in situ SiNx treatment
Ashraf H, Rao DVS, Gogova D, Siche D, Fornari R, Humphreys CJ, Hageman PR
Journal of Crystal Growth, 312(4), 595, 2010
2 Properties and preparation of high quality, free-standing GaN substrates and study of spontaneous separation mechanism
Ashraf H, Kudrawiec R, Weyher JL, Serafinczuk J, Misiewicz J, Hageman PR
Journal of Crystal Growth, 312(16-17), 2398, 2010
3 Enhanced growth rates and reduced parasitic deposition by the substitution of Cl-2 for HCl in GaN HVPE
Bohnen T, Ashraf H, van Dreumel GWG, Verhagen S, Weyher JL, Hageman PR, Vlieg E
Journal of Crystal Growth, 312(18), 2542, 2010
4 ScAlN nanowires: A cathodoluminescence study
Bohnen T, Yazdi GR, Yakimova R, van Dreumel GWG, Hageman PR, Vlieg E, Algra RE, Verheijen MA, Edgar JH
Journal of Crystal Growth, 311(11), 3147, 2009
5 On the nucleation, coalescence, and overgrowth of HVPE GaN on misoriented sapphire substrates and the origin of pinholes
Bohnen T, de Jong AEF, van Enckevort WJP, Weyher JL, van Dreumel GWG, Ashraf H, Hageman PR, Vlieg E
Journal of Crystal Growth, 311(23-24), 4685, 2009
6 HVPE of scandium nitride on 6H-SiC(0001)
Edgar JH, Bohnen T, Hageman PR
Journal of Crystal Growth, 310(6), 1075, 2008
7 Thick GaN layers grown by HVPE: Influence of the templates
Ashraf H, Weyher JL, van Dreumel GWG, Gzregorzyck A, Hageman PR
Journal of Crystal Growth, 310(17), 3957, 2008
8 Influence of sapphire annealing in a trimethylaluminum atmosphere on GaN epitaxy by metal-organic chemical vapor deposition
Grzegorczyk AP, Weyher JL, Hageman PR, Larsen PK
Thin Solid Films, 516(8), 2314, 2008
9 Influence of In on the surface morphology of HYPE grown GaN
Dam CEC, Hageman PR, van Enckevort WJP, Bohnen T, Larsen PK
Journal of Crystal Growth, 307(1), 19, 2007
10 Screening effect in contactless electroreflectance spectroscopy observed for AlGaN/GaN heterostructures with two dimensional electron gas
Motyka M, Kudrawiec R, Syperek M, Misiewicz J, Rudzinski M, Hageman PR, Larsen PK
Thin Solid Films, 515(11), 4662, 2007