검색결과 : 7건
| No. | Article |
|---|---|
| 1 |
Electrochemical and Surface Analysis of the Corrosion Protection of Copper by Nanometer-Thick Alumina Coatings Prepared by Atomic Layer Deposition Mirhashemihaghighi S, Swiatowska J, Maurice V, Seyeux A, Klein LH, Harkonen E, Ritala M, Marcus P Journal of the Electrochemical Society, 162(8), C377, 2015 |
| 2 |
Interface control of atomic layer deposited oxide coatings by filtered cathodic arc deposited sublayers for improved corrosion protection Harkonen E, Tervakangas S, Kolehmainen J, Diaz B, Swiatowska J, Maurice V, Seyeux A, Marcus P, Fenker M, Toth L, Radnoczi G, Ritala M Materials Chemistry and Physics, 147(3), 895, 2014 |
| 3 |
Tantalum oxide nanocoatings prepared by atomic layer and filtered cathodic arc deposition for corrosion protection of steel: Comparative surface and electrochemical analysis Diaz B, Swiatowska J, Maurice V, Seyeux A, Harkonen E, Ritala M, Tervakangas S, Kolehmainen J, Marcus P Electrochimica Acta, 90, 232, 2013 |
| 4 |
Hydrogen-argon plasma pre-treatment for improving the anti-corrosion properties of thin Al2O3 films deposited using atomic layer deposition on steel Harkonen E, Potts SE, Kessels WMM, Diaz B, Seyeux A, Swiatowska J, Maurice V, Marcus P, Radnoczi G, Toth L, Kariniemi M, Niinisto J, Ritala M Thin Solid Films, 534, 384, 2013 |
| 5 |
Failure mechanism of thin Al2O3 coatings grown by atomic layer deposition for corrosion protection of carbon steel Diaz B, Harkonen E, Maurice V, Swiatowska J, Seyeux A, Ritala M, Marcus P Electrochimica Acta, 56(26), 9609, 2011 |
| 6 |
Electrochemical and time-of-flight secondary ion mass spectrometry analysis of ultra-thin metal oxide (Al2O3 and Ta2O5) coatings deposited by atomic layer deposition on stainless steel Diaz B, Swiatowska J, Maurice V, Seyeux A, Normand B, Harkonen E, Ritala M, Marcus P Electrochimica Acta, 56(28), 10516, 2011 |
| 7 |
Corrosion Protection of Steel with Oxide Nanolaminates Grown by Atomic Layer Deposition Harkonen E, Diaz B, Swiatowska J, Maurice V, Seyeux A, Vehkamaki M, Sajavaara T, Fenker M, Marcus P, Ritala M Journal of the Electrochemical Society, 158(11), C369, 2011 |