검색결과 : 7건
| No. | Article |
|---|---|
| 1 |
The spliceosome is a therapeutic vulnerability in MYC-driven cancer Hsu TYT, Simon LM, Neill NJ, Marcotte R, Sayad A, Bland CS, Echeverria GV, Sun TT, Kurley SJ, Tyagi S, Karlin KL, Dominguez-Vidana R, Hartman JD, Renwick A, Scorsone K, Bernardi RJ, Skinner SO, Jain A, Orellana M, Lagisetti C, Golding I, Jung SY, Neilson JR, Zhang XHF, Cooper TA, Webb TR, Neel BG, Shaw CA, Westbrook TF Nature, 525(7569), 384, 2015 |
| 2 |
Dipole-Mediated Rectification of Intramolecular Photoinduced Charge Separation and Charge Recombination Bao DD, Upadhyayula S, Larsen JM, Xia B, Georgieva B, Nunez V, Espinoza EM, Hartman JD, Wurch M, Chang AD, Lin CK, Larkin J, Vasquez K, Beran GJO, Vullev VI Journal of the American Chemical Society, 136(37), 12966, 2014 |
| 3 |
Kepler-9: A System of Multiple Planets Transiting a Sun-Like Star, Confirmed by Timing Variations Holman MJ, Fabrycky DC, Ragozzine D, Ford EB, Steffen JH, Welsh WF, Lissauer JJ, Latham DW, Marcy GW, Walkowicz LM, Batalha NM, Jenkins JM, Rowe JF, Cochran WD, Fressin F, Torres G, Buchhave LA, Sasselov DD, Borucki WJ, Koch DG, Basri G, Brown TM, Caldwell DA, Charbonneau D, Dunham EW, Gautier TN, Geary JC, Gilliland RL, Haas MR, Howell SB, Ciardi DR, Endl M, Fischer D, Furesz G, Hartman JD, Isaacson H, Johnson JA, MacQueen PJ, Moorhead AV, Morehead RC, Orosz JA Science, 330(6000), 51, 2010 |
| 4 |
Photo-electron emission and atomic force microscopies of the hydrogen etched 6H-SiC(0001) surface and the initial growth of GaN and AlN Hartman JD, Naniwae K, Petrich C, Nemanich R, Davis RF Applied Surface Science, 242(3-4), 428, 2005 |
| 5 |
Characterization of hydrogen etched 6H-SiC(0001) substrates and subsequently grown AlN films Hartman JD, Roskowski AM, Reitmeier ZJ, Tracy KM, Davis RF, Nemanich RJ Journal of Vacuum Science & Technology A, 21(2), 394, 2003 |
| 6 |
Schottky barrier height and electron affinity of titanium on AIN Ward BL, Hartman JD, Hurt EH, Tracy KM, Davis RF, Nemanich RJ Journal of Vacuum Science & Technology B, 18(4), 2082, 2000 |
| 7 |
Photo-emission electron microscopy (PEEM) of cleaned and etched 6H-SiC(0001) Hartman JD, Naniwae K, Petrich C, Ramachandran V, Feenstra RM, Nemanich RJ, Davis RF Materials Science Forum, 338-3, 353, 2000 |