검색결과 : 16건
| No. | Article |
|---|---|
| 1 |
Small-angle Neutron Scattering (SANS) Characterization of Clay- and Carbonate-rich Shale at Elevated Pressures Neil CW, Hjelm RP, Hawley ME, Watkins EB, Cockreham C, Wu D, Mao YM, Fischer TB, Stokes MR, Xu HW Energy & Fuels, 34(7), 8178, 2020 |
| 2 |
A rejuvenation process to enhance the durability of low Pt loaded polymer electrolyte membrane fuel cells Langlois DA, Lee AS, Macauley N, Maurya S, Hawley ME, Yim SD, Kim YS Journal of Power Sources, 396, 345, 2018 |
| 3 |
Resonant soft x-ray scattering and reflectivity study of the phase-separated structure of thin poly(styrene-b-methyl methacrylate) films Welch CF, Hjelm RP, Mang JT, Hawley ME, Wrobleski DA, Orler EB, Kortright JB Journal of Polymer Science Part B: Polymer Physics, 51(2), 149, 2013 |
| 4 |
Epitaxial Superconducting delta-MoN Films Grown by a Chemical Solution Method Zhang YY, Haberkorn N, Ronning F, Wang HY, Mara NA, Zhuo MJ, Chen L, Lee JH, Blackmore KJ, Bauer E, Burrell AK, McCleskey TM, Hawley ME, Schulze RK, Civale L, Tajima T, Jia QX Journal of the American Chemical Society, 133(51), 20735, 2011 |
| 5 |
A Chemical Solution Approach to Epitaxial Metal Nitride Thin Films Luo HM, Lin Y, Wang HY, Lee JH, Suvorova NA, Mueller AH, Burrell AK, McCleskey TM, Bauer E, Usov IO, Hawley ME, Holesinger TG, Jia QX Advanced Materials, 21(2), 193, 2009 |
| 6 |
Epitaxial Ternary Nitride Thin Films Prepared by a Chemical Solution Method Luo HM, Wang HY, Bi ZX, Feldmann DM, Wang YQ, Burrell AK, McCleskey TM, Bauer E, Hawley ME, Jia QX Journal of the American Chemical Society, 130(46), 15224, 2008 |
| 7 |
Self-assembled epitaxial nanocomposite BaTiO3-NiFe2O4 films prepared by polymer-assisted deposition Luo HM, Yang H, Bally SA, Ugurlu O, Jain M, Hawley ME, McCleskey TM, Burrell AK, Bauer E, Civale L, Holesinger TG, Jia QX Journal of the American Chemical Society, 129(46), 14132, 2007 |
| 8 |
Strongly enhanced current densities in superconducting coated conductors of YBa2Cu3O7-x+BaZrO3 Macmanus-Driscoll JL, Foltyn SR, Jia QX, Wang H, Serquis A, Civale L, Maiorov B, Hawley ME, Maley MP, Peterson DE Nature Materials, 3(7), 439, 2004 |
| 9 |
Scanning tunneling microscopy imaging of charged defects on clean Si(100)-(2X1) Brown GW, Grube H, Hawley ME, Schofield SR, Curson NJ, Simmons MY, Clark RG Journal of Vacuum Science & Technology A, 21(4), 1506, 2003 |
| 10 |
Real-time spectroscopic ellipsometry as a characterization tool for oxide molecular beam epitaxy Gibbons BJ, Hawley ME, Trolier-McKinstry S, Schlom DG Journal of Vacuum Science & Technology A, 19(2), 584, 2001 |