검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Studies of metallic multilayer structures, optical properties, and oxidation using in situ spectroscopic ellipsometry Gao X, Hale J, Heckens S, Woollam JA Journal of Vacuum Science & Technology A, 16(2), 429, 1998 |
| 2 |
In-Situ Ellipsometry on Sputtered Dielectric and Magnetooptic Thin-Films Heckens S, Woollam JA Thin Solid Films, 270(1-2), 65, 1995 |