화학공학소재연구정보센터
검색결과 : 6건
No. Article
1 Optical emission spectroscopy as a tool for studying, optimizing, and monitoring plasma-assisted atomic layer deposition processes
Mackus AJM, Heil SBS, Langereis E, Knoops HCM, van de Sanden MCM, Kessels WMM
Journal of Vacuum Science & Technology A, 28(1), 77, 2010
2 Plasma-assisted atomic layer deposition of Ta2O5 from alkylamide precursor and remote O-2 plasma
Heil SBS, Roozeboom F, van de Sanden MCM, Kessels WMM
Journal of Vacuum Science & Technology A, 26(3), 472, 2008
3 Plasma and thermal ALD of Al2O3 in a commercial 200 mm ALD reactor
van Hemmen JL, Heil SBS, Klootwijk JH, Roozeboom F, Hodson CJ, van de Sanden MCM, Kessels WMM
Journal of the Electrochemical Society, 154(7), G165, 2007
4 Deposition of TiN and HfO2 in a commercial 200 mm remote plasma atomic layer deposition reactor
Heil SBS, van Hemmen JL, Hodson CJ, Singh N, Klootwijk JH, Roozeboom F, de Sanden MCMV, Kessels WMM
Journal of Vacuum Science & Technology A, 25(5), 1357, 2007
5 Low-temperature deposition of TiN by plasma-assisted atomic layer deposition
Heil SBS, Langereis E, Roozeboom F, van de Sanden MCM, Kessels WMM
Journal of the Electrochemical Society, 153(11), G956, 2006
6 Plasma-assisted atomic layer deposition of TiN monitored by in situ spectroscopic ellipsometry
Heil SBS, Langereis E, Kemmeren A, Roozeboom F, de Sanden MCMV, Kessels WMM
Journal of Vacuum Science & Technology A, 23(4), L5, 2005