화학공학소재연구정보센터
검색결과 : 22건
No. Article
1 Plasma etch fabrication of 60:1 aspect ratio silicon nanogratings with 200 nm pitch
Mukherjee P, Bruccoleri A, Heilmann RK, Schattenburg ML, Kaplan AF, Guo LJ
Journal of Vacuum Science & Technology B, 28(6), C6P70, 2010
2 Spatial-frequency multiplication with multilevel interference lithography
Chang CH, Zhao Y, Heilmann RK, Schattenburg ML
Journal of Vacuum Science & Technology B, 26(6), 2135, 2008
3 Fabrication of 200 nm period blazed transmission gratings on silicon-on-insulator wafers
Ahn M, Heilmann RK, Schattenburg ML
Journal of Vacuum Science & Technology B, 26(6), 2179, 2008
4 Phase control in multiexposure spatial frequency multiplication
Zhao Y, Chang CH, Heilmann RK, Schattenburg ML
Journal of Vacuum Science & Technology B, 25(6), 2439, 2007
5 Fabrication of ultrahigh aspect ratio freestanding gratings on silicon-on-insulator wafers
Ahn M, Heilmann RK, Schattenburg ML
Journal of Vacuum Science & Technology B, 25(6), 2593, 2007
6 Doppler writing and linewidth control for scanning beam interference lithography
Montoya JC, Chang CH, Heilmann RK, Schattenburg ML
Journal of Vacuum Science & Technology B, 23(6), 2640, 2005
7 Monolayer/bilayer transition in Langmuir films of derivatized gold nanoparticles at the gas/water interface: An x-ray scattering study
Fukuto M, Heilmann RK, Pershan PS, Badia A, Lennox RB
Journal of Chemical Physics, 120(7), 3446, 2004
8 High fidelity blazed grating replication using nanoimprint lithography
Chang CH, Montoya JC, Akilian M, Lapsa A, Heilmann RK, Schattenburg ML, Li M, Flanagan KA, Rasmussen AP, Seely JF, Laming JM, Kjornrattanawanich B, Goray LI
Journal of Vacuum Science & Technology B, 22(6), 3260, 2004
9 Internal segregation and side chain ordering in hairy-rod polypeptide monolayers at the gas/water interface: An x-ray scattering study
Fukuto M, Heilmann RK, Pershan PS, Yu SJM, Soto CM, Tirrell DA
Journal of Chemical Physics, 119(12), 6253, 2003
10 Fabrication of sawtooth diffraction gratings using nanoimprint lithography
Chang CH, Heilmann RK, Fleming RC, Carter J, Murphy E, Bailey TC, Ekerdt JG, Frankel RD, Voisin R
Journal of Vacuum Science & Technology B, 21(6), 2755, 2003