검색결과 : 13건
No. | Article |
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1 |
Microstructure and charge trapping in ZrO2- and Si3N4-based superlattice layer systems with Ge nanoparticles Seidel S, Rebohle L, Prucnal S, Lehninger D, Hubner R, Klemm V, Skorupa W, Heitmann J Thin Solid Films, 645, 124, 2018 |
2 |
Optical and structural characterization of Ge clusters embedded in ZrO2 Agocs E, Zolnai Z, Rossall AK, van den Berg JA, Fodor B, Lehninger D, Khomenkova L, Ponomaryov S, Gudymenko O, Yukhymchuk V, Kalas B, Heitmann J, Petrik P Applied Surface Science, 421, 283, 2017 |
3 |
Optical properties of Zr and ZrO2 Petrik P, Sulyok A, Novotny T, Perez-Fero E, Kalas B, Agocs E, Lohner T, Lehninger D, Khomenkova L, Nagy R, Heitmann J, Menyhard M, Hozer Z Applied Surface Science, 421, 744, 2017 |
4 |
Extreme biomimetic approach for synthesis of nanocrystalline chitin-(Ti,Zr)O-2 multiphase composites Wysokowski M, Motylenko M, Rafaja D, Koltsov I, Stocker H, Szalaty TJ, Bazhenov VV, Stelling AL, Beyer J, Heitmann J, Jesionowski T, Petovic S, Durovic M, Ehrlich H Materials Chemistry and Physics, 188, 115, 2017 |
5 |
Temperature stable Au nanoparticles embedded in Er3+ doped ZrO2 sol-gel thin films prepared by spin coating Seidel S, Sabelfeld A, Strohmeyer R, Schreiber G, Klemm V, Rafaja D, Joseph Y, Heitmann J Thin Solid Films, 606, 13, 2016 |
6 |
Influence of the substrate grade on structural and optical properties of GaN/AlGaN superlattices Schubert F, Zybell S, Heitmann J, Mikolajick T, Schmult S Journal of Crystal Growth, 425, 145, 2015 |
7 |
Degradation of multicrystalline silicon solar cells and modules after illumination at elevated temperature Kersten F, Engelhart P, Ploigt HC, Stekolnikov A, Lindner T, Stenzel F, Bartzsch M, Szpeth A, Petter K, Heitmann J, Muller JW Solar Energy Materials and Solar Cells, 142, 83, 2015 |
8 |
Trap related dielectric absorption of HfSiO films in metal-insulator-semiconductor structures Kerber M, Fachmann C, Heitmann J, Kudelka S, Schroder U, Reisinger H Journal of Vacuum Science & Technology B, 27(1), 321, 2009 |
9 |
Correlation of microscopic and macroscopic electrical characteristics of high-k ZrSixO2-x thin films using tunneling atomic force microscopy Weinreich W, Wilde L, Kucher P, Lemberger M, Yanev V, Rommel M, Bauer AJ, Erben E, Heitmann J, Schroder U, Oberbeck L Journal of Vacuum Science & Technology B, 27(1), 364, 2009 |
10 |
Conformity and structure of titanium oxide films grown by atomic layer deposition on silicon substrates Jogi I, Pars M, Aarik J, Aidla A, Laan M, Sundqvist J, Oberbeck L, Heitmann J, Kukli K Thin Solid Films, 516(15), 4855, 2008 |