화학공학소재연구정보센터
검색결과 : 17건
No. Article
1 Pyrolysis of energy cane bagasse and invasive Chinese tallow tree (Triadica sebifera L.) biomass in an inductively heated reactor
Henkel C, Muley PD, Abdollahi KK, Marculescu C, Boldor D
Energy Conversion and Management, 109, 175, 2016
2 A critical comparison of pyrolysis of cellulose, lignin, and pine sawdust using an induction heating reactor
Muley PD, Henkel C, Abdollahi KK, Marculescu C, Boldor D
Energy Conversion and Management, 117, 273, 2016
3 Pyrolysis and Catalytic Upgrading of Pinewood Sawdust Using an Induction Heating Reactor
Muley PD, Henkel C, Abdollahi KK, Boldor D
Energy & Fuels, 29(11), 7375, 2015
4 Electrical characterization of thulium silicate interfacial layers for integration in high-k/metal gate CMOS technology
Litta ED, Hellstrom PE, Henkel C, Ostling M
Solid-State Electronics, 98, 20, 2014
5 High-Deposition-Rate Atomic Layer Deposition of Thulium Oxide from TmCp3 and H2O
Litta ED, Hellstrom PE, Henkel C, Valerio S, Hallen A, Ostling M
Journal of the Electrochemical Society, 160(11), D538, 2013
6 A Stringent Limit on a Drifting Proton-to-Electron Mass Ratio from Alcohol in the Early Universe
Bagdonaite J, Jansen P, Henkel C, Bethlem HL, Menten KM, Ubachs W
Science, 339(6115), 46, 2013
7 A manufacturable process integration approach for graphene devices
Vaziri S, Lupina G, Paussa A, Smith AD, Henkel C, Lippert G, Dabrowski J, Mehr W, Ostling M, Lemme MC
Solid-State Electronics, 84, 185, 2013
8 Stability of La2O3 and GeO2 passivated Ge surfaces during ALD of ZrO2 high-k dielectric
Bethge O, Henkel C, Abermann S, Pozzovivo G, Stoeger-Pollach M, Werner WSM, Smoliner J, Bertagnolli E
Applied Surface Science, 258(8), 3444, 2012
9 Impact of oxidation and reduction annealing on the electrical properties of Ge/La2O3/ZrO2 gate stacks
Henkel C, Hellstrom PE, Ostling M, Stoger-Pollach M, Bethge O, Bertagnolli E
Solid-State Electronics, 74, 7, 2012
10 ALD high-k layer grating couplers for single and double slot on-chip SOI photonics
Naiini MM, Henkel C, Mahn GB, Ostling M
Solid-State Electronics, 74, 58, 2012