검색결과 : 9건
| No. | Article |
|---|---|
| 1 |
Analysis of nitrogen species in titanium oxynitride ALD films Sowinska M, Brizzi S, Das C, Karkkanen I, Schneidewind J, Naumann F, Gargouri H, Henkel K, Schmeisser D Applied Surface Science, 381, 42, 2016 |
| 2 |
Spectroscopic and capacitance-voltage characterization of thin aminopropylmethoxysilane films doped with copper phthalocyanine, tris(dimethylvinylsilyloxy)-POSS and fullerene cages Klocek J, Henkel K, Kolanek K, Zschech E, Schmeisser D Applied Surface Science, 258(10), 4213, 2012 |
| 3 |
The effect of X-ray photoelectron spectroscopy measurement on P(VDF-TrFE) copolymer thin films Mandal D, Muller K, Henkel K, Schmeisser D Applied Surface Science, 261, 209, 2012 |
| 4 |
Studies of the chemical and electrical properties of fullerene and 3-aminopropyltrimethoxysilane based low-k materials Klocek J, Henkel K, Kolanek K, Broczkowska K, Schmeisser D, Miller M, Zschech E Thin Solid Films, 520(7), 2498, 2012 |
| 5 |
Comment on "Preparation and Characterization of Silver-Poly(vinylidene fluoride) Nanocomposites: Formation of Piezoelectric Polymorph of Poly(vinylidene fluoride)" Mandal D, Henkel K, Schmeisser D Journal of Physical Chemistry B, 115(35), 10567, 2011 |
| 6 |
Optimization of the AION buffer layer for PrXOY/Si stacks Henkel K, Burkov Y, Karavaev K, Torche M, Schwiertz C, Schmeisser D Journal of Vacuum Science & Technology B, 27(1), 253, 2009 |
| 7 |
Electrical investigations on metal/ferroelectric/insulator/semiconductor structures using poly[vinylidene fluoride trifluoroethylene] as ferroelectric layer for organic nonvolatile memory applications Henkel K, Lazareva I, Mandal D, Paloumpa I, Muller K, Koval Y, Muller P, Schmeisser D Journal of Vacuum Science & Technology B, 27(1), 504, 2009 |
| 8 |
Organic field effect transistors with ferroelectric hysteresis Muller K, Henkel K, Paloumpa I, Schmeiber D Thin Solid Films, 515(19), 7683, 2007 |
| 9 |
Polymeric electrodes Appel G, Mikalo R, Henkel K, Oprea A, Yfantis A, Paloumpa I, Schmeisser D Solid-State Electronics, 44(5), 855, 2000 |